Service & Support - Process Test Chip
Process Test Chip

NCAP can provide the standard dummy wafer with the following specifications. If other requirement, can be customized also.

RDL        TSV        BumpingOxide WaferCu Wafer


1. RDL

Specifications:

Item

Single Side RDL

Double Side RDL

Min Si Thickness

60um

60um

Copper Thickness

>6um

>6um

Copper Line/Space

Min 10um/10um

Min 10um/10um

Chip Size

Target ±20um

Target ±20um

Min Chip Size

0.6mm×0.3mm

0.6mm×0.3mm

Tape&Reel

Min die thickness 90um

Min die thickness 90um

Structure Diagram:

20190829_2

20190829_3


 

2. TSV

Specifications:

Item

TSV 10:100

TSV 20:200

Wafer size

300mm

300mm

Si Thickness

100um±10um

200um±10um

Via size

10um±1.5um

20um±3um

Metal layers

Top side:3
Bottom side:2

Top side:3
Bottom side:2

Copper Line/Space

Min 10um/10um

Min 10um/10um

Micro Bump Pitch

Min 40um

Min 40um


Structure Diagram:

文本框: TSV20190829_4 


 

3. Bumping

Specifications:

Item

Wafer Bumping

Wafer Size

300mm/200mm

Bump Pitch

Min 80um

Bump Size

Min 50um

Bump Height

<80um

RDL Line/Space

Min 10um/10um

 

Structure Diagram:

 

20190830_5

 

4. Oxide Wafer

Specifications:

Item

Oxide Wafer

Oxide Wafer

Wafer size

300mm

200mm

SiO2 Thickness

0.1um~6um

0.1um~6um

 


5. Cu Wafer

Specifications:

Item

Cu Wafer

Cu Wafer

Wafer size

300mm

200mm

Cu Thickness

≥1um

≥1um